DocumentCode
2837554
Title
Intelligent CMOS control of RF MEMS capacitive switches
Author
Ding, G. ; Wang, W. ; Halder, S. ; Palego, C. ; Molinero, D. ; Hwang, J.C.M. ; Goldsmith, C.L.
Author_Institution
Lehigh University, Bethlehem, PA 18015, USA
fYear
2012
fDate
17-22 June 2012
Firstpage
1
Lastpage
3
Abstract
A CMOS control circuit capable of closed-loop capacitance sensing and control of RF MEMS switches was designed, fabricated, and tested. The control was based on fine-tuning the magnitude of the bias voltage of the switches according to the difference between sensed and targeted capacitances. Intelligence could be programmed by periodically alternating the sign of the bias voltage when its magnitude to maintain the targeted capacitance drifted significantly due to dielectric charging. Such an intelligent control could also be used to compensate for process variation, ambient temperature change, and RF power loading, which would make RF MEMS capacitive switches not only more reliable, but also more robust.
Keywords
CMOS integrated circuits; Capacitance; Micromechanical devices; Microswitches; Radio frequency; Sensors; Closed loop systems; capacitance measurement; capacitance-voltage characteristics; intelligent control; radio-frequency micro-electromechanical systems;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Symposium Digest (MTT), 2012 IEEE MTT-S International
Conference_Location
Montreal, QC, Canada
ISSN
0149-645X
Print_ISBN
978-1-4673-1085-7
Electronic_ISBN
0149-645X
Type
conf
DOI
10.1109/MWSYM.2012.6257781
Filename
6257781
Link To Document