• DocumentCode
    2837554
  • Title

    Intelligent CMOS control of RF MEMS capacitive switches

  • Author

    Ding, G. ; Wang, W. ; Halder, S. ; Palego, C. ; Molinero, D. ; Hwang, J.C.M. ; Goldsmith, C.L.

  • Author_Institution
    Lehigh University, Bethlehem, PA 18015, USA
  • fYear
    2012
  • fDate
    17-22 June 2012
  • Firstpage
    1
  • Lastpage
    3
  • Abstract
    A CMOS control circuit capable of closed-loop capacitance sensing and control of RF MEMS switches was designed, fabricated, and tested. The control was based on fine-tuning the magnitude of the bias voltage of the switches according to the difference between sensed and targeted capacitances. Intelligence could be programmed by periodically alternating the sign of the bias voltage when its magnitude to maintain the targeted capacitance drifted significantly due to dielectric charging. Such an intelligent control could also be used to compensate for process variation, ambient temperature change, and RF power loading, which would make RF MEMS capacitive switches not only more reliable, but also more robust.
  • Keywords
    CMOS integrated circuits; Capacitance; Micromechanical devices; Microswitches; Radio frequency; Sensors; Closed loop systems; capacitance measurement; capacitance-voltage characteristics; intelligent control; radio-frequency micro-electromechanical systems;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Symposium Digest (MTT), 2012 IEEE MTT-S International
  • Conference_Location
    Montreal, QC, Canada
  • ISSN
    0149-645X
  • Print_ISBN
    978-1-4673-1085-7
  • Electronic_ISBN
    0149-645X
  • Type

    conf

  • DOI
    10.1109/MWSYM.2012.6257781
  • Filename
    6257781