Measurement of high-speed photodiodes using a microwave reflectometer to improve accuracy

A novel single-detector microwave reflectometer technique which corrects source mismatch errors is presented. Scalar optoelectronic measurements are used to determine the corrected optoelectronic response and the vector reflection coefficient of a high-speed photodiode. A GaInAs photodiode has been measured up to 40 GHz using a distributed feedback laser heterodyne system at 1532 nm. Results corrected for source mismatch using reflection coefficient measurements are compared with the results with the single-detector reflectometer technique