Title :
The measurement of refractive index in the visible and infrared at NPL
Author_Institution :
NPL, Teddington, UK
Abstract :
NPL offer the refractive index measurement facilities over a wide spectral range for bulk materials and thin films. Some of these facilities may be suitable for optical waveguide device measurements. The new method under investigation using a confocal microscope show great promise, however much calibration work is necessary before an estimation of uncertainty can be made. Evanescent field microscopy require further investigations
Keywords :
optical microscopes; optical microscopy; optical waveguides; refractive index measurement; NPL facilities; bulk materials; confocal microscope; evanescent field microscopy; infrared; optical waveguide device measurements; refractive index measurement facilities; thin films; visible; wide spectral range;
Conference_Titel :
Measurements on Optical Devices, IEE Colloquium on
Conference_Location :
London
