• DocumentCode
    283802
  • Title

    Optical confinement in (AlGa)InP visible emitting laser diodes

  • Author

    Griffiths, K. ; Burke, S.V. ; Blood, P.

  • Author_Institution
    Dept. of Phys. & Astron., Univ. of Wales Coll. of Cardiff, UK
  • fYear
    1992
  • fDate
    33927
  • Firstpage
    42461
  • Lastpage
    42469
  • Abstract
    Measurement of the far-field pattern of bulk and quantum well GaInP lasers have been used to determine optical confinement factor for individual laser diodes under operating conditions. Using the experimentally determined far-field pattern to find the optical confinement factor has been shown to be a useful tool where there is uncertainty in the refractive index and composition data for laser diodes. Another advantage of this method over theoretical calculations is that the optical confinement factor is determined for individual lasers under operating conditions, hence the effects of temperature and carrier injection on the refractive index are automatically taken into account
  • Keywords
    III-V semiconductors; aluminium compounds; gallium compounds; indium compounds; laser variables measurement; semiconductor lasers; AlGaInP visible emitting laser diodes; III-V semiconductors; bulk; carrier injection; effects of temperature; far-field pattern; operating conditions; optical confinement factor; quantum well; refractive index;
  • fLanguage
    English
  • Publisher
    iet
  • Conference_Titel
    Measurements on Optical Devices, IEE Colloquium on
  • Conference_Location
    London
  • Type

    conf

  • Filename
    211787