Title :
A W-Band Low-Noise PLL With a Fundamental VCO in SiGe for Millimeter-Wave Applications
Author :
Shinwon Kang ; Jun-Chau Chien ; Niknejad, Ali M.
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., Univ. of California at Berkeley, Berkeley, CA, USA
Abstract :
A W-band fundamental phase-locked loop (PLL) is designed and fully integrated to achieve high output power and low noise in a 0.13-μm SiGe BiCMOS process. A PLL with a fundamental voltage-controlled oscillator (VCO) is chosen after comparing several frequency-synthesizer architectures. Local oscillator (LO) generation and LO distribution are also considered. The employed free-running VCO achieves a tuning range from 92.5 to 102.5 GHz (8.3%), an output power of 6 dBm, and a phase noise of -124.5 dBc/Hz at 10-MHz offset. The locking range of the PLL is from 92.7 to 100.2 GHz, and the phase noise is -102 dBc/Hz at 1-MHz offset. The root mean square jitter integrated from 1 MHz to 1 GHz is 71 fs. Finally, the figure-of-merit for VCOs is discussed.
Keywords :
BiCMOS analogue integrated circuits; Ge-Si alloys; bipolar MIMIC; frequency synthesizers; millimetre wave oscillators; phase locked loops; phase noise; semiconductor materials; voltage-controlled oscillators; BiCMOS process; LO distribution; PLL; SiGe; W-band fundamental phase-locked loop; W-band low-noise PLL; figure-of-merit; free-running VCO; frequency 92.5 GHz to 102.5 GHz; frequency-synthesizer architectures; fundamental VCO; local oscillator generation; phase noise; root mean square jitter; size 0.13 nm; time 71 fs; voltage-controlled oscillator; Frequency synthesizers; Phase locked loops; Phase noise; Power generation; Varactors; Voltage-controlled oscillators; Colpitts oscillator; Gilbert-mixer phase detector (PD); LO generation; Miller divider; W-band; frequency synthesizer; fundamental oscillator; local oscillator (LO) distribution; millimeter-wave applications; phase noise; phase-locked loop (PLL); reference spur; voltage-controlled oscillator (VCO);
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
DOI :
10.1109/TMTT.2014.2345342