Ratio parameters: a new signature for exhaustive testing

A new approach for exhaustive testing of combinational circuits is presented. Its main advantage over other testing schemes is that the fault coverage for single stuck-at faults is significantly high. It is also established that for unate functions, all single stuck at faults and multiple stuck at faults at the terminals are testable. It seems that for irredundant realizations of general boolean functions, most of the faults also are detectable. The time needed in this approach is the same as the other existing exhaustive schemes. However, some extra hardware is needed for storage and comparison of the ratio parameters compared to the other exhaustive schemes. The technique is also suitable for the built-in self test (BIST) of VLSI circuits