Title :
Fault diagnosis for analog integrated circuits based on the circuit layout
Author :
Liu, Hain-Ching H. ; Soma, Mani
Author_Institution :
Dept. of Electr. Eng., Washington Univ., Seattle, WA, USA
Abstract :
An approach to the fault diagnosis for analog integrated circuits is proposed. It uses fault models from the defect statistics to generate faulty circuits. Fault simulations are then applied to those faulty circuits to generate different fault classes which can be used for the fault diagnosis for analog integrated circuits. An example is also given to demonstrate this approach
Keywords :
SPICE; fault location; integrated circuit testing; linear integrated circuits; analog integrated circuits; circuit layout; defect statistics; fault classes; fault models; faulty circuits; Analog circuits; Analog integrated circuits; Circuit faults; Circuit simulation; Circuit testing; Fault diagnosis; Fault location; Integrated circuit testing; Probability; Statistics;
Conference_Titel :
Fault Tolerant Systems, 1991. Proceedings., Pacific Rim International Symposium on
Conference_Location :
Kawasaki
Print_ISBN :
0-8186-2275-X
DOI :
10.1109/{RFTS.1991.212953
