Title :
DC Breakdown Strength Of Dielectric Materials At Cryogenic Temperatures
Author :
Chowdhuri, P. ; Bement, T.R. ; Espinoza, C.N. ; Weeks, G.
Author_Institution :
Los Alamos Scientific Laboratory
Keywords :
Cryogenics; Dielectric breakdown; Dielectric materials; Helium; Impulse testing; Insulators; Materials testing; Stress; Temperature; US Department of Energy;
Conference_Titel :
Transmission and Distribution Conference and Exposition, 1979. 7 IEEE/PES
DOI :
10.1109/TDC.1979.712652
