DocumentCode
2838895
Title
Optical Spectrum Based Estimation of Grades in Mineral Flotation
Author
Haavisto, Olli ; Kaartinen, Jani ; Hyötyniemi, Heikki
Author_Institution
Helsinki Univ. of Technol., Helsinki
fYear
2006
fDate
15-17 Dec. 2006
Firstpage
2529
Lastpage
2534
Abstract
Mineral enrichment by notation is one of the hardest industrial processes to monitor and control. The main process measurements collected from a flotation circuit are the metal contents or grades in the different phases of the circuit. To improve the process monitoring capabilities, machine vision systems have previously been developed to characterize the flotation froth properties from digital images of the froth. This study discusses an on-line measurement of the optical froth spectrum in order to improve the slurry grade measurements obtained from the X-ray fluorescence based Courier analyzer. It is shown that the grades of the zinc flotation circuit concentrate can be estimated with a linear multiregression model using the measured froth spectra as input values. The model is then applied to estimate the grades of the concentrate between the originally sparse X-ray fluorescence measurements. Additionally, some preliminary results are presented which suggest that also the spectra measured directly from a slurry flow may correlate with the corresponding grade values.
Keywords
X-ray fluorescence analysis; computer vision; computerised monitoring; industrial waste; mineral processing industry; mining industry; process monitoring; regression analysis; slurries; spectral analysis; Courier analyzer; X-ray fluorescence measurement; flotation froth properties; industrial process; machine vision system; mineral flotation circuit; mining industry; multiregression model; on-line measurement; optical froth spectrum; optical spectrum; process control; process monitoring; slurry grade measurement; zinc flotation circuit; Circuits; Condition monitoring; Electrical equipment industry; Fluorescence; Industrial control; Machine vision; Minerals; Mining industry; Phase measurement; Slurries;
fLanguage
English
Publisher
ieee
Conference_Titel
Industrial Technology, 2006. ICIT 2006. IEEE International Conference on
Conference_Location
Mumbai
Print_ISBN
1-4244-0726-5
Electronic_ISBN
1-4244-0726-5
Type
conf
DOI
10.1109/ICIT.2006.372673
Filename
4237995
Link To Document