Title :
Electrical Properties of Undoped and Lanthanum Doped BaTi0.6Zr0.4O3
Author :
Dash, M.S. ; Bera, J. ; Ghosh, S.
Author_Institution :
Nat. Inst. of Technol., Rourkela
Abstract :
Lanthanum doped BaTi0.6Zr0.4O3 composition x = 0.005, 0.01, 0.02, 0.05 and 0.1 in Ba1-xLaxTi0.6[1-5x/12]Zr0.4O3 were prepared by modified chemical route. (COOH)2ldr2H2O, Ba(NO3)2, ZrOCl2ldr8H2O and La2O3 are used to precipitate barium oxalate hydrate, lanthanum oxalate hydrate and zirconium oxy-hydroxide from its water solution onto the surface of suspended TiO2 particles. The lanthanum doped BaTi0.6Zr0.4O3 composition was found to be cubic by XRD analysis. A gradual shift of 2thetas angles to the higher angle with increasing lanthanum percentage in the BTZ reveals the contraction of perovskite lattice. The frequency dependence of dielectric permittivity and loss tan delta of the ceramics has been investigated. It is found that dielectric permittivity (epsivtau) decreases and loss tan delta decreases with increase in lanthanum percentage. Neither of the samples shows semiconductivity, which is believed to be because of titanium vacancy compensation.
Keywords :
X-ray diffraction; barium compounds; ceramics; dielectric losses; lanthanum; permittivity; vacancies (crystal); BaTi0.6Zr0.4O3:La; TiO2 particles; XRD analysis; barium oxalate hydrate; ceramics; dielectric permittivity; lanthanum doped compounds; lanthanum oxalate hydrate; lanthanum undoped compounds; loss tan delta; modified chemical route; perovskite lattice; titanium vacancy compensation; water solution; zirconium oxy-hydroxide; Barium; Ceramics; Chemicals; Dielectric losses; Frequency dependence; Lanthanum; Lattices; Permittivity; X-ray scattering; Zirconium;
Conference_Titel :
Industrial Technology, 2006. ICIT 2006. IEEE International Conference on
Conference_Location :
Mumbai
Print_ISBN :
1-4244-0726-5
Electronic_ISBN :
1-4244-0726-5
DOI :
10.1109/ICIT.2006.372695
