Title :
2005 IEEE International SOI Conference (QSIC 2005) (IEEE Cat. No. 05CH37694)
Abstract :
The following topics are dealt with: device characterisation, circuit techniques and applications; SOI materials, technology and characterisation; multiple gate devices; device processes; radiations and optics; and memory design techniques.
Keywords :
CMOS integrated circuits; MOSFET; field effect integrated circuits; integrated circuit technology; integrated memory circuits; silicon; silicon-on-insulator; CMOS circuits; MOSFET; SOI materials; SOI technology; circuit techniques; device characterisation; device process; memory design; multiple gate devices;
Conference_Titel :
SOI Conference, 2005. Proceedings. 2005 IEEE International
Conference_Location :
Honolulu, HI
Print_ISBN :
0-7803-9212-4
DOI :
10.1109/SOI.2005.1563511
