Functional Built-In Self-Test for processor cores in SoC

A methodology for organization of at-speed functional Built-In Self-Test in processors, based on real functional routines is presented. The proposed self-test includes on-chip test application and response collection by using the functionality of the processor under test. We use divide-and-conquer approach. At component level, tests are targeting faults in components. At processor level, the functionality of the processor is used to apply functional test patterns to each component at-speed. Differently from usual Built-in Self-Test schemes, the test patterns are not needed to store in the chip under test, they will be generated on-line by the resources of the system.