• DocumentCode
    2839501
  • Title

    Packaging of devices for topside cooling by replacing air-bridges with Su-8 polymer bridges [MESFET example]

  • Author

    Wright, Joshua I. ; Fillion, Raymond ; Meyer, Laura ; Shaddock, David

  • Author_Institution
    Gen. Electr. Global Res. & Dev. Center, Niskayuna, NY, USA
  • fYear
    2004
  • fDate
    2004
  • Firstpage
    63
  • Lastpage
    68
  • Abstract
    This paper takes an in-depth look at the qualifications of Su-8 photoresist as a low-k dielectric in the fabrication of integrated circuits (ICs). This paper discusses replacing air bridges on MESFET devices with polymer bridges fabricated from Su-8. This polymer bridge structure has several impacts for on-wafer processing as well as topside cooling packaging techniques for microwave devices. For on-wafer processing, replacing airbridges with polymer bridges eliminates the need for wafer thinning, through-wafer vias, and provides a dielectric interface material for Cu interconnects. Eliminating processing steps as well as the fragile topside air-bridge structures improves both the yield and the reliability. From a packaging perspective, fabricating polymer bridges allows further topside processing to take place in order to build packaging structures that can both remove the FET generated heat from the topside of the device as well as have access to the electrical I/Os.
  • Keywords
    Schottky gate field effect transistors; cooling; dielectric thin films; microwave devices; photoresists; polymer films; semiconductor device packaging; Cu; MESFET devices; Su-8 photoresist; Su-8 polymer bridges; air-bridge replacements; device packaging; interconnect dielectric interface; low-k dielectric; microwave devices; on-wafer processing; reliability; topside cooling; yield; Bridge circuits; Cooling; Dielectrics; Fabrication; Integrated circuit packaging; MESFETs; Microwave devices; Polymers; Qualifications; Resists;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Advanced Packaging Materials: Processes, Properties and Interfaces, 2004. Proceedings. 9th International Symposium on
  • Print_ISBN
    0-7803-8436-9
  • Type

    conf

  • DOI
    10.1109/ISAPM.2004.1287990
  • Filename
    1287990