DocumentCode :
2839552
Title :
Luminescence study on GaInP doped with Er by OMVPE
Author :
Fujiwara, Y. ; Ito, T. ; Kawamoto, T. ; Takeda, Y.
Author_Institution :
Dept. of Mater. Sci. & Eng., Nagoya Univ., Japan
fYear :
1998
fDate :
11-15 May 1998
Firstpage :
603
Lastpage :
606
Abstract :
Er-related photoluminescence due to intra-4f shell transitions of Er3+ ions has successfully been observed in GaInP doped with Er by OMVPE. In GaInP grown on GaP and InP, the luminescence intensity increased gradually with increasing Ga composition, while the spectral shape was invariant. In GaInP grown on GaAs, the luminescence spectrum was dominated by three emission lines whose relative intensity depended on the Ga composition. Thermal quenching of the Er-related luminescence became gradually small with increasing Ga composition, i.e., increasing band gap, which reflects deep-level properties of Er in excitation mechanism of the 4f shell
Keywords :
III-V semiconductors; MOCVD coatings; erbium; gallium compounds; indium compounds; photoluminescence; semiconductor epitaxial layers; semiconductor growth; vapour phase epitaxial growth; GaInP:Er; OMVPE; band gap; deep-level properties; emission lines; gap; intra-4f shell transitions; luminescence intensity; photoluminescence; Erbium; Gallium arsenide; III-V semiconductor materials; Indium phosphide; Inductors; Luminescence; Optical fiber communication; Photoluminescence; Photonic band gap; Temperature dependence;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Indium Phosphide and Related Materials, 1998 International Conference on
Conference_Location :
Tsukuba
ISSN :
1092-8669
Print_ISBN :
0-7803-4220-8
Type :
conf
DOI :
10.1109/ICIPRM.1998.712694
Filename :
712694
Link To Document :
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