Title :
High aspect ratio metal-polymer composite structures for nano interconnects
Author :
Aggarwal, Ankur O. ; Raj, P. Markondeya ; Tummala, Rao R.
Author_Institution :
Packaging Res. Center, Georgia Inst. of Technol., Atlanta, GA, USA
Abstract :
This paper presents a novel low-temperature process that combines high-aspect-ratio polymer structures with electroless copper plating to create laterally compliant MEMS structures. These structures are evaluated as IC-package interconnects that can lead to reliable, low-cost and high-performance nano wafer-level packaging. High-aspect-ratio low CTE polyimide structures with low stress, high toughness and strength were fabricated using plasma etching, This dry etching process was tuned to yield a wall angle above 80 degrees leading to an aspect ratio higher than 4. The etching process also leads to roughened sidewalls for selective electroless plating on the sidewalls of the polymer structures. Simulations of these fabricated structures show tremendous reduction in the stresses at the interfaces and superior reliability as IC-package nano interconnects. Metal-coated polymer structures from MEMS fabrication techniques can provide low-cost high-performance solutions for wafer-level-packaging.
Keywords :
adhesion; copper; electroless deposited coatings; integrated circuit interconnections; integrated circuit packaging; micromechanical devices; nanoelectronics; polymer films; semiconductor device packaging; sputter etching; Cu; IC-package interconnects; adhesion strength; electroless copper plating; high toughness; high-aspect-ratio polymer structures; interfacial shear stresses; laterally compliant MEMS structures; low CTE polyimide structures; low stress; low-cost packaging; metal-polymer composite; nano wafer-level packaging; plasma etching; roughened sidewalls; Copper; Dry etching; Fabrication; Micromechanical devices; Plasma applications; Plasma simulation; Polyimides; Polymers; Stress; Wafer scale integration;
Conference_Titel :
Advanced Packaging Materials: Processes, Properties and Interfaces, 2004. Proceedings. 9th International Symposium on
Print_ISBN :
0-7803-8436-9
DOI :
10.1109/ISAPM.2004.1288010