The GMMT experience of die procurement using the ESA SCC specification system

Author

Lindsay, C.E.

Author_Institution

GEC-Marconi Mater. Technol. Ltd., Towcester, UK

fYear

1998

fDate

1998

Firstpage

2

Lastpage

6

Abstract

This paper describes the experience of GEC-Marconi Materials Technology Ltd (GMMT) Caswell in both gaining European Space Agency (ESA) approval and in delivering bare GaAs MMIC die for European satellite systems. The rationale used by ESA dramatically reduces both the cost and timescales for die procurement whilst assuring the highest possible quality of the delivered die

Keywords

III-V semiconductors; MESFET integrated circuits; environmental stress screening; field effect MMIC; gallium arsenide; integrated circuit reliability; integrated circuit testing; process control; ESA SCC specification system; European Space Agency; European satellite systems; GEC-Marconi Materials Technology; GaAs; MMIC process reliability; bare GaAs MMIC die; delivered die quality; die procurement; dynamic evaluation circuit; process control monitors; technology characterisation vehicle; wafer acceptance testing; wafer screening; Circuit testing; Costs; Electric variables measurement; Gallium arsenide; MMICs; Phase change materials; Process control; Procurement; Temperature measurement; Vehicles;

fLanguage

English

Publisher

ieee

Conference_Titel

GaAs Reliability Workshop, 1998. Proceedings

Conference_Location

Atlanta, GA

Print_ISBN

0-7908-0065-9

Type

conf

DOI

10.1109/GAASRW.1998.768028

Filename

768028