Title :
The GMMT experience of die procurement using the ESA SCC specification system
Author_Institution :
GEC-Marconi Mater. Technol. Ltd., Towcester, UK
Abstract :
This paper describes the experience of GEC-Marconi Materials Technology Ltd (GMMT) Caswell in both gaining European Space Agency (ESA) approval and in delivering bare GaAs MMIC die for European satellite systems. The rationale used by ESA dramatically reduces both the cost and timescales for die procurement whilst assuring the highest possible quality of the delivered die
Keywords :
III-V semiconductors; MESFET integrated circuits; environmental stress screening; field effect MMIC; gallium arsenide; integrated circuit reliability; integrated circuit testing; process control; ESA SCC specification system; European Space Agency; European satellite systems; GEC-Marconi Materials Technology; GaAs; MMIC process reliability; bare GaAs MMIC die; delivered die quality; die procurement; dynamic evaluation circuit; process control monitors; technology characterisation vehicle; wafer acceptance testing; wafer screening; Circuit testing; Costs; Electric variables measurement; Gallium arsenide; MMICs; Phase change materials; Process control; Procurement; Temperature measurement; Vehicles;
Conference_Titel :
GaAs Reliability Workshop, 1998. Proceedings
Conference_Location :
Atlanta, GA
Print_ISBN :
0-7908-0065-9
DOI :
10.1109/GAASRW.1998.768028
