Title :
TESTABILITY FEATURES OF THE 68HC16Z1
Author :
Lyon, Jose A. ; Gladden, Mike ; Hartung, Eytan ; Hoang, Eric ; Raghunathan, K.
Keywords :
Circuit testing; Clocks; Counting circuits; Digital signal processing chips; Logic testing; Microcontrollers; Random access memory; Registers; System testing; Voltage;
Conference_Titel :
Test Conference, 1991, Proceedings., International
Print_ISBN :
0-8186-9156-5
DOI :
10.1109/TEST.1991.519502
