Title :
Orientational dependence of `true´ SC-cuts [crystal resonator]
Author :
EerNisse, Errol P. ; Kusters, John A.
Author_Institution :
Quartztronics, Inc., Salt Lake City, UT, USA
Abstract :
An experimental matrix method for defining the best crystallographic orientation for a specific mounting and packaging configuration is presented. The theoretical background is discussed. Some experimental evidence is reviewed. It is found that to achieve the maximum benefits, both static stress compensation for planar effects, and thermal transient compensation for planar and non-planar thermal effects are required. The methods for testing resonators and choosing the correct φ angle are presented
Keywords :
compensation; crystal orientation; crystal resonators; packaging; φ angle; crystal resonator; crystallographic orientation; experimental matrix; mounting; nonplanar thermal effects; packaging; planar effects; static stress compensation; testing; thermal effects; thermal transient compensation; Cities and towns; Crystalline materials; Electrodes; Geometry; Graphics; Manufacturing; Packaging; Resonant frequency; Temperature; Thermal stresses;
Conference_Titel :
Frequency Control, 1990., Proceedings of the 44th Annual Symposium on
Conference_Location :
Baltimore, MD
DOI :
10.1109/FREQ.1990.177496
