Title :
Limited-angle tomography for multiple-image radiography
Author :
Majidi, Keivan ; Brankov, Jovan G. ; Li, Jun ; Muehleman, Carol ; Wernick, Miles N.
Author_Institution :
Illinois Inst. of Technol., Chicago
fDate :
Oct. 26 2007-Nov. 3 2007
Abstract :
Multiple-image radiography (MIR) is an analyzer-based phase sensitive X-ray imaging method, which is a potential alternative for conventional radiography. MIR simultaneously generates three planar images containing information about attenuation, refraction and scattering properties of the object. These three planar images are linear projections of the corresponding properties inside the object. The linearity of the projections allows reconstruction of volumetric images by computed tomography (CT) methods. In this work, we apply limited-angle tomography to MIR images of a human thumb and compare the reconstructed slices near the focal plane of the imaging system with computed tomography (CT-MIR) reconstructions of the same data set. We also perform a task-based evaluation for Limited-Angle Tomography MIR (LAT- MIR) to investigate a sufficient range for data acquisition procedure. Specifically, we use template matching for detecting the cartilage in refraction image and measure the signal-to-noise ratio as detectability metric.
Keywords :
biological tissues; diagnostic radiography; image matching; image reconstruction; medical image processing; tomography; analyzer-based phase sensitive X-ray imaging method; attenuation information; cartilage detection; computed tomography methods; data acquisition procedure; focal plane images; human thumb; limited-angle tomography; linear projections; multiple-image radiography; refraction information; scattering properties; signal-to-noise ratio; template matching; volumetric image reconstruction; Attenuation; Computed tomography; Humans; Image analysis; Image generation; Image reconstruction; Linearity; Radiography; X-ray imaging; X-ray scattering;
Conference_Titel :
Nuclear Science Symposium Conference Record, 2007. NSS '07. IEEE
Conference_Location :
Honolulu, HI
Print_ISBN :
978-1-4244-0922-8
Electronic_ISBN :
1095-7863
DOI :
10.1109/NSSMIC.2007.4436785