DocumentCode :
2841265
Title :
Glass wafer mechanical properties: A comparison to silicon
Author :
Trott, Gary R. ; Shorey, Aric
Author_Institution :
Corning Inc., Corning, NY, USA
fYear :
2011
fDate :
19-21 Oct. 2011
Firstpage :
359
Lastpage :
362
Abstract :
Glass wafers derived from extensions of Coming´s fusion process have many attributes that make them attractive for use as carrier wafers in semiconductor manufacturing processes. Fusion is a mature manufacturing process that produces extremely high quality glass wafers with very low TTV and low warp. The wafers are cut from sheets, which makes it straightforward to scale up to 450 mm diameter wafers. Coming´s glass wafers have a CTE that closely matches that of silicon wafers, which is advantageous in avoiding deformation as the wafer stacks are heated and cooled. The optical properties of the material allow for easy inspection techniques to evaluate the quality of the bonds as well as other light/laser based processing. Since glass is a brittle material like silicon, it is important to carefully manage finishing processes. The glass is formed in thin sheets to a target thickness in the fusion process. Therefore it is not necessary to grind and polish the surface, thus avoiding strength limiting micro-flaws that can remain on the surface. Finally, it was shown that glass edges can be extremely strong when processed correctly. We have shown properties of Coming glass wafers to similar properties of silicon wafers.
Keywords :
glass; inspection; manufacturing processes; optical properties; semiconductor device manufacture; thermal expansion; Coming fusion process; bond quality evaluation; brittle material; coefficient of thermal expansion; finishing process; glass wafer mechanical property; inspection technique; laser based processing; light based processing; optical property; semiconductor manufacturing process; thin sheets; wafer stack; Bonding; Glass; Silicon; Substrates; Surface cracks; Surface treatment;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microsystems, Packaging, Assembly and Circuits Technology Conference (IMPACT), 2011 6th International
Conference_Location :
Taipei
ISSN :
2150-5934
Print_ISBN :
978-1-4577-1387-3
Electronic_ISBN :
2150-5934
Type :
conf
DOI :
10.1109/IMPACT.2011.6117158
Filename :
6117158
Link To Document :
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