CMOS open fault detection by appearance time of switching supply current

Author

Hashizume, Masaki ; Akita, Tetsuo ; Yotsuyanagi, Hiroyuki ; Tamesada, Takeomi

Author_Institution

Fac. of Eng., Tokushima Univ., Japan

fYear

2004

fDate

28-30 Jan. 2004

Firstpage

183

Lastpage

188

Abstract

In this paper, a new dynamic supply current test method is proposed for detecting open defects on signal lines in CMOS logic circuits. The method is based on the appearance time of dynamic supply current that flows when a test input vector is provided to a circuit under test. Also, we introduce our designed sensor circuit of the appearance time. Feasibility of tests based on the test method is examined by some experiments. The experimental results show that open defects on signal lines in CMOS logic circuits will be detected by the test method.

Keywords

CMOS logic circuits; fault diagnosis; integrated circuit testing; CMOS logic circuits; CMOS open fault detection; feasibility; open defects; sensor circuit; signal lines; supply current test method; switching supply current; test input vector; CMOS logic circuits; Circuit faults; Circuit testing; Current supplies; Delay; Electrical fault detection; Fault detection; Integrated circuit modeling; Logic testing; Semiconductor device modeling;

fLanguage

English

Publisher

ieee

Conference_Titel

Electronic Design, Test and Applications, Proceedings. DELTA 2004. Second IEEE International Workshop on

Conference_Location

Perth, WA, Australia

Print_ISBN

0-7695-2081-2

Type

conf

DOI

10.1109/DELTA.2004.10036

Filename

1409837