• DocumentCode
    2841289
  • Title

    TEST GRADING THE 68332

  • Author

    Cheng, Tony ; Hoang, Eric ; Rivera, David ; Haedge, Alan ; Fontenot, Jamie ; Carson, Glenn

  • fYear
    1991
  • fDate
    26-30 Oct 1991
  • Firstpage
    150
  • Keywords
    Automatic test pattern generation; Central Processing Unit; Design for testability; Logic testing; Manufacturing; Microcontrollers; Microprocessors; Performance evaluation; Pins; Productivity;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 1991, Proceedings., International
  • ISSN
    1089-3539
  • Print_ISBN
    0-8186-9156-5
  • Type

    conf

  • DOI
    10.1109/TEST.1991.519505
  • Filename
    519505
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2841289