Title :
SOC-B design and testing technique of IS-95C CDMA transmitter for measurement of electric field intensity using FPGA and ASIC
Author :
Kim, Chul ; Lee, Mike Myung-Ok ; Cho, Byung-Lok ; Eshraghian, Kamran
Author_Institution :
Centre for Very High Speed Microelectron. Syst., Edith Cowan Univ., Joondalup, WA, Australia
Abstract :
This paper describes the transmitter chip and system of Code Division Multiple Access (CDMA) for measurement of electric field intensity. The transmitter chip and system of CDMA is also designed in compliance with IS-95C standard of the Telecommunications Industry Association and the Electronic Industries Association (TIA/EIA/IS-95)and International Mobile Telecommunications 2000 (IMT-2000). Our suggested CDMA system can be uniquely fitted with next generation IMT-2000 without Qualcomm MSM chip. The CDMA system for the measurement of electric field intensity is verified performance using SOC-B (System On Chip-Board) of FPGA plus ASIC and the ASIC chip is followed by fabricating with 0.35 um CMOS technology.
Keywords :
CMOS integrated circuits; application specific integrated circuits; code division multiple access; electric field measurement; field programmable gate arrays; mobile radio; radio receivers; system-on-chip; ASIC; CDMA transmitter; CMOS technology; FPGA; Qualcomm MSM chip; Qualcomm metal-semiconductor-metal chip; SOC design; application specific integrated circuit; code division multiple access transmitter; complementary metal-oxide-semiconductor technology; electric field intensity measurement; electronic industries association; field programmable gate array; international mobile telecommunications; system-on-chip design; system-on-chip testing technique; telecommunications industry association; Application specific integrated circuits; CMOS technology; Electric variables measurement; Electronics industry; Field programmable gate arrays; Multiaccess communication; Semiconductor device measurement; Telecommunication standards; Testing; Transmitters;
Conference_Titel :
Electronic Design, Test and Applications, Proceedings. DELTA 2004. Second IEEE International Workshop on
Conference_Location :
Perth, WA, Australia
Print_ISBN :
0-7695-2081-2
DOI :
10.1109/DELTA.2004.10062
