DocumentCode
2841576
Title
Study on copper plating solutions for fast filling of through silicon via (TSV) in 3D electronic packaging
Author
Wu, H. L Henry ; Lee, S. W Ricky
Author_Institution
EPACK Lab., Hong Kong Univ. of Sci. & Technol., Kowloon, China
fYear
2011
fDate
19-21 Oct. 2011
Firstpage
343
Lastpage
346
Abstract
Copper electrodeposition in acidic cupric methanesulfonate electrolyte with organic additives was discussed in this study. The influence of the additives in acidic cupric methanesulfonate bath was studied by means of electrochemical measurement using a rotary electrode and actual TSV copper depositions. The electrochemical parameters including exchange current density and cathodic transfer coefficient of base cupric methanesulfonate electrolyte were successfully determined. Chronoamperometry (CA) was conducted to verify the diffusion time of additives to the surface of electrodes and the corresponding diffusion constants were characterized.
Keywords
additives; copper; electronics packaging; electroplating; three-dimensional integrated circuits; 3D electronic packaging; TSV copper deposition; acidic cupric methanesulfonate bath; acidic cupric methanesulfonate electrolyte; base cupric methanesulfonate electrolyte; cathodic transfer coefficient; chronoamperometry; copper electrodeposition; copper plating solution; electrochemical measurement; electrochemical parameter; exchange current density; organic additive; rotary electrode; through silicon via filling; Additives; Copper; Current density; Electrodes; Filling; Silicon; Through-silicon vias;
fLanguage
English
Publisher
ieee
Conference_Titel
Microsystems, Packaging, Assembly and Circuits Technology Conference (IMPACT), 2011 6th International
Conference_Location
Taipei
ISSN
2150-5934
Print_ISBN
978-1-4577-1387-3
Electronic_ISBN
2150-5934
Type
conf
DOI
10.1109/IMPACT.2011.6117173
Filename
6117173
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