Title :
The Best Flip-Flops to Scan
Author :
Abramovici, Miron ; Kulikowski, James J. ; Roy, Rabindra K.
Keywords :
Algorithm design and analysis; Circuit faults; Circuit testing; Electrical fault detection; Feedback circuits; Feedback loop; Flip-flops; Pipelines; Sequential analysis; Sequential circuits;
Conference_Titel :
Test Conference, 1991, Proceedings., International
Print_ISBN :
0-8186-9156-5
DOI :
10.1109/TEST.1991.519507
