DocumentCode
2841627
Title
The Best Flip-Flops to Scan
Author
Abramovici, Miron ; Kulikowski, James J. ; Roy, Rabindra K.
fYear
1991
fDate
26-30 Oct 1991
Firstpage
166
Keywords
Algorithm design and analysis; Circuit faults; Circuit testing; Electrical fault detection; Feedback circuits; Feedback loop; Flip-flops; Pipelines; Sequential analysis; Sequential circuits;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 1991, Proceedings., International
ISSN
1089-3539
Print_ISBN
0-8186-9156-5
Type
conf
DOI
10.1109/TEST.1991.519507
Filename
519507
Link To Document