DocumentCode
2841633
Title
Mode shape analysis techniques using synchrotron X-ray topography
Author
Capelle, B. ; Détaint, J. ; Zarka, A. ; Zheng, Y. ; Schwartzel, J.
Author_Institution
Lab. de Miner.-Cristallogr., Univ. Pierre et Marie Curie, Paris, France
fYear
1990
fDate
23-25 May 1990
Firstpage
416
Lastpage
423
Abstract
X-ray topography using synchrotron radiation is used to investigate vibrational states in quartz resonators. After a brief review of different methods and possibilities obtained with synchrotron radiation, some observations on vibration modes, especially on coupled piezo-electric components in quartz AT and BT resonators, are reported. The results from experiments reveal time-progressive components and several complex coupled components in AT and BT cuts
Keywords
crystal resonators; quartz; synchrotron radiation; vibration measurement; AT cuts; BT cuts; SiO2; complex coupled components; coupled piezo-electric components; observations; stroboscopic X-ray topography; synchrotron X-ray topography; synchrotron radiation; time-progressive components; vibration mode shape analysis; vibration modes; vibrational states in quartz resonators; Acoustic beams; Acoustic diffraction; Laboratories; Shape; Storage rings; Surfaces; Synchrotron radiation; Visualization; X-ray diffraction; X-ray imaging;
fLanguage
English
Publisher
ieee
Conference_Titel
Frequency Control, 1990., Proceedings of the 44th Annual Symposium on
Conference_Location
Baltimore, MD
Type
conf
DOI
10.1109/FREQ.1990.177527
Filename
177527
Link To Document