Title :
Mode shape analysis techniques using synchrotron X-ray topography
Author :
Capelle, B. ; Détaint, J. ; Zarka, A. ; Zheng, Y. ; Schwartzel, J.
Author_Institution :
Lab. de Miner.-Cristallogr., Univ. Pierre et Marie Curie, Paris, France
Abstract :
X-ray topography using synchrotron radiation is used to investigate vibrational states in quartz resonators. After a brief review of different methods and possibilities obtained with synchrotron radiation, some observations on vibration modes, especially on coupled piezo-electric components in quartz AT and BT resonators, are reported. The results from experiments reveal time-progressive components and several complex coupled components in AT and BT cuts
Keywords :
crystal resonators; quartz; synchrotron radiation; vibration measurement; AT cuts; BT cuts; SiO2; complex coupled components; coupled piezo-electric components; observations; stroboscopic X-ray topography; synchrotron X-ray topography; synchrotron radiation; time-progressive components; vibration mode shape analysis; vibration modes; vibrational states in quartz resonators; Acoustic beams; Acoustic diffraction; Laboratories; Shape; Storage rings; Surfaces; Synchrotron radiation; Visualization; X-ray diffraction; X-ray imaging;
Conference_Titel :
Frequency Control, 1990., Proceedings of the 44th Annual Symposium on
Conference_Location :
Baltimore, MD
DOI :
10.1109/FREQ.1990.177527
