DocumentCode :
2841678
Title :
On the influence of a fabrication imperfection on the normal acceleration sensitivity of contoured quartz resonators with rectangular supports
Author :
Zhou, Y.S. ; Tiersten, H.F.
Author_Institution :
Rensselaer Polytech. Inst., Troy, NY, USA
fYear :
1990
fDate :
23-25 May 1990
Firstpage :
452
Lastpage :
460
Abstract :
It is shown that the normal acceleration sensitivity of contoured quartz resonators with rectangular supports vanishes when the centers of the mode shape and support rectangle coincide. This result is essentially a consequence of symmetry and applies to many other shapes. Since it is extremely difficult to realize this situation in practice, an analysis of the influence of an offset of the centers on the normal acceleration sensitivity is performed. The biasing deformation is determined by means of a variational approximation procedure using the variational principle with all natural conditions for anisotropic static flexure. The very important accompanying strains which vary quadratically across the thickness are determined recursively. The resulting flexural biasing states are used in the existing perturbation equation along with the equivalent trapped energy mode shapes of the contoured resonators to calculate the normal acceleration sensitivities. It is shown that for small offsets the acceleration sensitivity increases linearly with offsets and orientations for which this effect is minimized
Keywords :
crystal resonators; frequency stability; quartz; SiO2; anisotropic static flexure; biasing deformation; contoured quartz resonators; equivalent trapped energy mode shapes; fabrication imperfections influence; flexural biasing states; mode location; normal acceleration sensitivity; perturbation equation; rectangular supports; symmetry; variational approximation procedure; Acceleration; Aerospace engineering; Anisotropic magnetoresistance; Capacitive sensors; Equations; Fabrication; Mechanical engineering; Performance analysis; Shape; Stress;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Frequency Control, 1990., Proceedings of the 44th Annual Symposium on
Conference_Location :
Baltimore, MD
Type :
conf
DOI :
10.1109/FREQ.1990.177531
Filename :
177531
Link To Document :
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