• DocumentCode
    2841724
  • Title

    Full wafer level stacking without TSV applications to memory-only and heterogeneous SiP

  • Author

    Val, Christian ; Noiray, Pascal Couderc J ; Boulay, Nadia

  • Author_Institution
    3D PLUS, Buc, France
  • fYear
    2011
  • fDate
    19-21 Oct. 2011
  • Firstpage
    298
  • Lastpage
    303
  • Abstract
    A technological break based on Wafer Level Package started in 2002; consists in only stacking Known Good Rebuilt Wafer (what Freescale named: RCP and Infineon named e-Wlb) instead of standard wafers. This approach allows to have a very good yield, on the contrary of the W2W with TSV technologies. Several applications will be presented on the medical area, industrial area and smart card area.
  • Keywords
    system-in-package; wafer level packaging; Freescale; Infineon; RCP; e-Wlb; full wafer level stacking; heterogeneous SiP; industrial area; medical area; memory-only SiP; rebuilt wafer; smart card area; IEEE catalog; Mechanical sensors; Pacemakers; Stacking; Three dimensional displays; Through-silicon vias;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microsystems, Packaging, Assembly and Circuits Technology Conference (IMPACT), 2011 6th International
  • Conference_Location
    Taipei
  • ISSN
    2150-5934
  • Print_ISBN
    978-1-4577-1387-3
  • Electronic_ISBN
    2150-5934
  • Type

    conf

  • DOI
    10.1109/IMPACT.2011.6117181
  • Filename
    6117181