Title :
An overview of the open architecture test system
Author :
Rajsuman, Rochit
Author_Institution :
Advantest America R&D Center, Santa Clara, CA, USA
Abstract :
An open architecture test system has been envisioned to address the re-usability of the test solutions. The open architecture provides a method and framework under which software and test instruments of different vendors can be developed and integrated into an automatic test equipment (ATE). The framework uses standard interfaces so that each modular unit (software or hardware) can be replaced with another modular unit from a different vendor. The basic structure of the Open Architecture Test System is described in this paper.
Keywords :
automatic test equipment; integrated circuit testing; multichip modules; parallel architectures; ATE; automatic test equipment; integrated circuit testing; modular unit; open architecture test system; standard interfaces; Application specific integrated circuits; Computer architecture; Costs; Hardware; Integrated circuit testing; Logic testing; Software testing; System testing; System-on-a-chip; Timing;
Conference_Titel :
Electronic Design, Test and Applications, Proceedings. DELTA 2004. Second IEEE International Workshop on
Conference_Location :
Perth, WA, Australia
Print_ISBN :
0-7695-2081-2
DOI :
10.1109/DELTA.2004.10026
