DocumentCode
2841963
Title
SEARCH STATE EQUIVALENCE FOR REDUNDANCY IDENTIFICATION AND TEST GENERATION
Author
Giraldi, John ; Bushnell, Michael L.
fYear
1991
fDate
26-30 Oct 1991
Firstpage
184
Keywords
Acceleration; Automatic test pattern generation; Automatic testing; Built-in self-test; Circuit faults; Circuit testing; Combinational circuits; Life estimation; Redundancy; Test pattern generators;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 1991, Proceedings., International
ISSN
1089-3539
Print_ISBN
0-8186-9156-5
Type
conf
DOI
10.1109/TEST.1991.519509
Filename
519509
Link To Document