Title :
Numerical emulation of the degradation of 975nm high power tapered laser bars
Author :
Amuzuvi, C.K. ; Bull, S. ; Lim, J.J. ; Sujecki, S. ; Larkins, E.C.
Author_Institution :
Photonic & RF Eng. Group, Univ. of Nottingham, Nottingham, UK
Abstract :
We have demonstrated the simulation tool for both single and multiple emitters. Investigations of a model bar with a non-uniform temperature distribution showed that the hotter emitters at the centre of the bar drew more current and emitted higher powers, but also degraded faster than the cooler edge emitters. Similar behaviour has been observed experimentally. However, the simulation results for a real bar showed poor agreement with the observed power distribution. This was attributed to thermal crosstalk between the emitters and is being addressed by the introduction of a global thermal model to Barlase.
Keywords :
lasers; Barlase; cooler edge emitters; global thermal model; hotter emitters; multiple emitters; numerical emulation; power tapered laser bars; single emitters; wavelength 975 nm; Aging; Bars; Emulation; Laser modes; Laser theory; Power engineering and energy; Power lasers; Reliability engineering; Temperature distribution; Thermal degradation;
Conference_Titel :
High Power Diode Lasers and Systems Conference, 2009. HPD 2009
Conference_Location :
Coventry
Print_ISBN :
978-1-4244-5545-4
Electronic_ISBN :
978-1-4244-5546-1
DOI :
10.1109/HPD.2009.5364831
