Numerical emulation of the degradation of 975nm high power tapered laser bars

Author

Amuzuvi, C.K. ; Bull, S. ; Lim, J.J. ; Sujecki, S. ; Larkins, E.C.

Author_Institution

Photonic & RF Eng. Group, Univ. of Nottingham, Nottingham, UK

fYear

2009

fDate

14-14 Oct. 2009

Firstpage

1

Lastpage

2

Abstract

We have demonstrated the simulation tool for both single and multiple emitters. Investigations of a model bar with a non-uniform temperature distribution showed that the hotter emitters at the centre of the bar drew more current and emitted higher powers, but also degraded faster than the cooler edge emitters. Similar behaviour has been observed experimentally. However, the simulation results for a real bar showed poor agreement with the observed power distribution. This was attributed to thermal crosstalk between the emitters and is being addressed by the introduction of a global thermal model to Barlase.

Keywords

lasers; Barlase; cooler edge emitters; global thermal model; hotter emitters; multiple emitters; numerical emulation; power tapered laser bars; single emitters; wavelength 975 nm; Aging; Bars; Emulation; Laser modes; Laser theory; Power engineering and energy; Power lasers; Reliability engineering; Temperature distribution; Thermal degradation;

fLanguage

English

Publisher

ieee

Conference_Titel

High Power Diode Lasers and Systems Conference, 2009. HPD 2009

Conference_Location

Coventry

Print_ISBN

978-1-4244-5545-4

Electronic_ISBN

978-1-4244-5546-1

Type

conf

DOI

10.1109/HPD.2009.5364831

Filename

5364831