Title :
Proceedings. DELTA 2004. Second IEEE International Workshop on Electronic Design, Test and Applications
Abstract :
The following topics are dealt with: VLSI and microphotonics; advanced analog and mixed signal design techniques; open architecture test system; fault tolerance; application specific circuits and systems; scan testing; digital systems and circuits; current testing; education in electronics; real time systems; FPGA; signal and image processing systems; DFT and BIST.
Keywords :
VLSI; boundary scan testing; built-in self test; design for testability; digital integrated circuits; electronic engineering education; fault tolerance; field programmable gate arrays; image processing; integrated circuit design; integrated circuit testing; mixed analogue-digital integrated circuits; real-time systems; BIST; DFT; FPGA; VLSI; analog signal design; application specific circuits; built-in self test; current testing; design for testability; digital circuits; digital systems; education; electronic design; fault tolerance; field programmable gate arrays; image processing systems; microphotonics; mixed signal design; open architecture test system; real time systems; scan testing; signal processing systems; very large scale integration;
Conference_Titel :
Electronic Design, Test and Applications, Proceedings. DELTA 2004. Second IEEE International Workshop on
Conference_Location :
Perth, WA, Australia
Print_ISBN :
0-7695-2081-2
DOI :
10.1109/DELTA.2004.2
