Title :
Low cost CPU I/O analyzer under system conditions
Author :
Zobin, Genadly ; Sotman, Michael ; Kostinsky, Alexey
Author_Institution :
WTM Sci. Center, Intel Israel, Haifa, Israel
Abstract :
This paper describes new methodology of component I/O testing under system conditions, enabling analog validation of modem buses without the need for full system functionality. The inexpensive implementation is appropriate for chips with IBIST-DFT functionality.
Keywords :
analogue integrated circuits; built-in self test; system buses; test equipment; CPU I/O analyzer; I/O testing; IBIST-DFT functionality; analog validation; built-in self-test; design for testability; high speed bus validation; modem buses; Clocks; Costs; Design for testability; Frequency; Low voltage; Modems; Operating systems; System testing; Vehicles; Voltage control;
Conference_Titel :
Electrical Performance of Electronic Packaging, 2005. IEEE 14th Topical Meeting on
Print_ISBN :
0-7803-9220-5
DOI :
10.1109/EPEP.2005.1563693
