DocumentCode
2842285
Title
Minimal Test Sets for Combinational Circuits
Author
Tromp, Gert Jan
fYear
1991
fDate
26-30 Oct 1991
Firstpage
204
Keywords
Automatic testing; Benchmark testing; Circuit faults; Circuit testing; Combinational circuits; Compaction; Fault detection; NP-hard problem; Pattern matching; Test pattern generators;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 1991, Proceedings., International
ISSN
1089-3539
Print_ISBN
0-8186-9156-5
Type
conf
DOI
10.1109/TEST.1991.519511
Filename
519511
Link To Document