DocumentCode
2842406
Title
A Digital Offset Self-Calibration Technique for 3-Bit Flash Converter of an Ultra High-Speed Folding and Interpolating ADC
Author
Yu, Jinshan ; Zhang, Ruitao ; Lei, Zhang ; Zhang, Zhengping ; Wang, Yonglu ; Can, Zhu ; Zhou, Yu
Author_Institution
Nat. Lab. of Analog IC´´s, Chongqing, China
Volume
1
fYear
2010
fDate
13-14 Oct. 2010
Firstpage
11
Lastpage
13
Abstract
This paper proposed a digital offset self-calibration technique for the flash converter of an ultra high-speed folding and interpolating ADC. The chip is processed in 0.18-μm CMOS technology. The measured results show that the digital calibration technique can efficiently improve the ADC characteristics.
Keywords
CMOS integrated circuits; analogue-digital conversion; calibration; CMOS technology; digital offset self-calibration technique; flash converter; interpolating ADC; size 0.18 mum; ultra high-speed folding; word length 3 bit; CMOS integrated circuits; CMOS technology; Calibration; Computer architecture; Converters; Interpolation; Radiation detectors; Ultra High-Speed; analog-to-digital converter; folding; interpolating; wide-bandwidth;
fLanguage
English
Publisher
ieee
Conference_Titel
Intelligent System Design and Engineering Application (ISDEA), 2010 International Conference on
Conference_Location
Changsha
Print_ISBN
978-1-4244-8333-4
Type
conf
DOI
10.1109/ISDEA.2010.76
Filename
5743119
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