• DocumentCode
    2842427
  • Title

    Spectrum response analysis for PCB with heating ICs in different heating conditions

  • Author

    Wang, Bor-Tsuen ; Lee, Yau-Chang ; Lai, Yi-Shao ; Yeh, Chang-Lin ; Lee, Ying-Chih

  • Author_Institution
    Dept. of Mech. Eng., Nat. Pingtung Univ. of Sci. & Technol., Pingtung, Taiwan
  • fYear
    2011
  • fDate
    19-21 Oct. 2011
  • Firstpage
    198
  • Lastpage
    201
  • Abstract
    Coupling effects of both thermal and vibration loadings on printed circuit board (PCB) are of interest. This paper aims to study the random vibration excitation of PCB with four heating ICs that are used to emulate the temperature elevation during operations. Two levels of heating conditions as well as without heating are considered in this work. The vibration tests according to JESD22-B103-B are carried out to measure the random vibration response of PCB under the conditions of both with and without heating. The finite element (FE) model of PCB with heating ICs is constructed and performed spectrum response analysis with and without thermal effects. The temperature distributions on PCB are first verified and shown good agreement between finite element analysis (FEA) and experiments. The power spectral density (PSD) functions of the acceleration on the PCB in heating are also obtained and compared for both FEA and experiments. The RMS accelerations on the PCB can be calculated and matched well between the analytical and experimental results. The fatigue evaluation due to coupling loadings from thermal and vibration effects on the PCB is also addressed. This work presents the systematic approaches in studying spectrum response analysis of PCB with both thermal and vibration coupling loads and shows a very good agreement results between FEA and experiments.
  • Keywords
    dynamic testing; finite element analysis; heating; integrated circuit testing; printed circuit design; thermal management (packaging); PCB; RMS acceleration; coupling effect; coupling loading; fatigue evaluation; finite element analysis; finite element model; heating IC; heating condition; power spectral density; printed circuit board; random vibration excitation; spectrum response analysis; temperature distribution; temperature elevation; thermal effects; thermal loading; vibration effects; vibration loading; vibration test; Acceleration; Finite element methods; Heating; Integrated circuit modeling; Stress; Thermal loading; Vibrations;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microsystems, Packaging, Assembly and Circuits Technology Conference (IMPACT), 2011 6th International
  • Conference_Location
    Taipei
  • ISSN
    2150-5934
  • Print_ISBN
    978-1-4577-1387-3
  • Electronic_ISBN
    2150-5934
  • Type

    conf

  • DOI
    10.1109/IMPACT.2011.6117220
  • Filename
    6117220