DocumentCode :
2842448
Title :
ESTIMATING THE QUALITY OF MANUFACTURED DIGITAL SEQUENTIAL CIRCUITS
Author :
Das, Dharam Vir ; Seth, Sharad C. ; Agrawal, Vishwani D.
fYear :
1991
fDate :
26-30 Oct 1991
Firstpage :
210
Keywords :
Circuit faults; Circuit testing; Combinational circuits; Electrical fault detection; Fault detection; Flip-flops; Manufacturing; Probability; Sequential analysis; Sequential circuits;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Conference, 1991, Proceedings., International
ISSN :
1089-3539
Print_ISBN :
0-8186-9156-5
Type :
conf
DOI :
10.1109/TEST.1991.519512
Filename :
519512
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2842448
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