DocumentCode
2842448
Title
ESTIMATING THE QUALITY OF MANUFACTURED DIGITAL SEQUENTIAL CIRCUITS
Author
Das, Dharam Vir ; Seth, Sharad C. ; Agrawal, Vishwani D.
fYear
1991
fDate
26-30 Oct 1991
Firstpage
210
Keywords
Circuit faults; Circuit testing; Combinational circuits; Electrical fault detection; Fault detection; Flip-flops; Manufacturing; Probability; Sequential analysis; Sequential circuits;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 1991, Proceedings., International
ISSN
1089-3539
Print_ISBN
0-8186-9156-5
Type
conf
DOI
10.1109/TEST.1991.519512
Filename
519512
Link To Document