Title :
Using S-parameters successfully in time domain link simulations
Author :
Kaller, Dierk ; Schuster, Christian ; Kwark, Young ; Altabella, Dulce ; Truong, Bao ; Chen, Zhaoqing ; Haridass, Anand ; Klink, Erich
Author_Institution :
IBM Deutschland Entwicklung GmbH, Boeblingen, Germany
Abstract :
Eye diagrams measured or simulated in time domain are widely used for characterization of electrical links. On the other hand frequency domain characterization by means of S-parameter measurements is gaining considerable ground. For direct comparison of eye diagrams, S-parameters have to be converted into time domain responses. In this paper we discuss criteria for the evaluation of the "goodness" of S-parameters for use in time domain link simulations.
Keywords :
S-parameters; circuit simulation; frequency-domain analysis; time-domain analysis; S-parameter measurements; electrical link characterization; eye diagrams; frequency domain characterization; time domain link simulations; Bit error rate; Circuit simulation; Connectors; Electromagnetic measurements; Equivalent circuits; Frequency domain analysis; Frequency measurement; Scattering parameters; Testing; Time measurement;
Conference_Titel :
Electrical Performance of Electronic Packaging, 2005. IEEE 14th Topical Meeting on
Print_ISBN :
0-7803-9220-5
DOI :
10.1109/EPEP.2005.1563710
