DocumentCode :
2842572
Title :
The microwave performance of SiGe/Si HBTs and amplifiers
Author :
Lixin, Zhao ; GuangDi, Shen
Author_Institution :
Dept. of Electron. Eng., Beijing Polytech. Univ., China
fYear :
1998
fDate :
1998
Firstpage :
96
Lastpage :
99
Abstract :
In this paper, we analyze the SiGe/Si HBT´s microwave performance, including the following factors: (1) when the base width reduces to the lower hundreds angstrom, the emitter delay time and the collector delay time became more important factors for the cutoff frequency fT of SiGe HBTs; (2) the influence of the low doping emitter layer on the emitter delay time; (3) besides the capacitance resulting from the change of the fixed charges in the heterojunction, the free carrier injection in the emitter base space charge region results in additional capacitance for a heterojunction operating at forward bias; (4) hence, we give the equivalent circuits of SiGe HBTs, analyze and optimize the cutoff frequency of SiGe HBTs, and simulate the microwave performance of SiGe HBTs and its amplifier. The novel fT=10 GHz SiGe HBTs and amplifier have been fabricated, the results of testing are in agreement with those of simulation
Keywords :
Ge-Si alloys; S-parameters; capacitance; elemental semiconductors; equivalent circuits; heterojunction bipolar transistors; microwave amplifiers; microwave bipolar transistors; semiconductor device models; semiconductor materials; silicon; space charge; 10 GHz; HBT amplifiers; SiGe-Si; SiGe/Si HBTs; base width; capacitance; collector delay time; cutoff frequency; emitter base space charge region; emitter delay time; free carrier injection; heterojunction; low doping emitter layer; microwave performance; Capacitance; Cutoff frequency; Delay effects; Doping; Germanium silicon alloys; Heterojunctions; Microwave amplifiers; Performance analysis; Silicon germanium; Space charge;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave and Millimeter Wave Technology Proceedings, 1998. ICMMT '98. 1998 International Conference on
Conference_Location :
Beijing
Print_ISBN :
0-7803-4308-5
Type :
conf
DOI :
10.1109/ICMMT.1998.768234
Filename :
768234
Link To Document :
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