DocumentCode :
2842665
Title :
Study on flip chip assembly of high density micro-LED array
Author :
An, Chao-Chyun ; Wu, Ming-Hsien ; Huang, Yu-Wei ; Chen, Tai-Hong ; Chao, Chia-Hsin ; Yeh, Wen-Yung
Author_Institution :
Electron. & Optoelectron. Res. Labs., Ind. Technol. Res. Inst., Hsinchu, Taiwan
fYear :
2011
fDate :
19-21 Oct. 2011
Firstpage :
336
Lastpage :
338
Abstract :
Flip chip assembly technology is an attractive solution for high I/O density and fine-pitch microelectronics packaging. Recently, high efficient GaN-based light-emitting diodes (LEDs) have undergone a rapid development and flip chip bonding has been widely applied to fabricate high-brightness GaN micro-LED arrays. The flip chip GaN LED has some advantages over the traditional top-emission LED, including improved current spreading, higher light extraction efficiency, better thermal dissipation capability and the potential of further optical component integration. With the advantages of flip chip assembly, micro-LED (μLED) arrays with high I/O density can be performed with improved luminous efficiency than conventional p-side-up micro-LED arrays and are suitable for many potential applications, such as micro-displays, bio-photonics and visible light communications (VLC), etc. In particular, μLED array based self-emissive micro-display has the promising to achieve high brightness and contrast, reliability, long-life and compactness, which conventional micro-displays like LCD, OLED, etc, cannot compete with. In this study, GaN micro-LED array device with flip chip assembly package process was presented. The bonding quality of flip chip high density micro-LED array is tested by daisy chain test. The p-n junction tests of the devices are measured for electrical characteristics. The illumination condition of each micro-diode pixel was examined under a forward bias. Failure mode analysis was performed using cross sectioning and scanning electron microscopy (SEM). Finally, the fully packaged micro-LED array device is demonstrated as a prototype of dice projector system.
Keywords :
electronics packaging; flip-chip devices; gallium compounds; light emitting diodes; p-n junctions; GaN-based light-emitting diodes; bio-photonics; electrical characteristics; failure mode analysis; flip chip GaN LED; flip chip assembly package process; flip chip bonding; high density micro-LED array; high-brightness GaN micro-LED arrays; micro-diode pixel; microelectronics packaging; optical component integration; p-n junction tests; scanning electron microscopy; thermal dissipation capability; visible light communication; Arrays; Bonding; Flip chip; Gallium nitride; Light emitting diodes; Silicon; Substrates;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microsystems, Packaging, Assembly and Circuits Technology Conference (IMPACT), 2011 6th International
Conference_Location :
Taipei
ISSN :
2150-5934
Print_ISBN :
978-1-4577-1387-3
Electronic_ISBN :
2150-5934
Type :
conf
DOI :
10.1109/IMPACT.2011.6117235
Filename :
6117235
Link To Document :
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