• DocumentCode
    2842863
  • Title

    A model to predict current distributions in heavy current parallel conductor configurations

  • Author

    Ghandakly, Adel A. ; Curran, Richard L.

  • Author_Institution
    Dept. of Electr. Eng., Toledo Univ., OH, USA
  • fYear
    1991
  • fDate
    Sept. 28 1991-Oct. 4 1991
  • Firstpage
    1098
  • Abstract
    The authors present a model for predicting the current distribution in high-current cables consisting of relatively widely spaced parallel conductors. These cables are typically used in electric glass melters to interconnect the power transformers and the melter secondary bus installations. Due to mutual inductive coupling between the conductors, electromagnetic forces will cause uneven current distribution. The proposed model has been developed to account for these forces in specified parallel conductor configurations. The model also takes into account the skin effect impact on the individual conductor resistances and self-inductances. The model is coded in a simple computer program which can be used to predict current distributions in electric glass melters and similar heavy current applications. Results obtained using the proposed model for a Scott-T transformer with a variety of multiconductor cable configurations are presented for demonstration purposes.<>
  • Keywords
    conductors (electric); electric heating; glass industry; power cables; power engineering computing; power transformers; Scott-T transformer; computer program; current distribution; electric glass melters; electromagnetic forces; high-current cables; melter secondary bus installations; mutual inductive coupling; power transformers; resistances; self-inductances; skin effect; widely spaced parallel conductors; Cables; Conductors; Current distribution; Electromagnetic coupling; Electromagnetic forces; Glass; Mutual coupling; Power transformers; Predictive models; Skin effect;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industry Applications Society Annual Meeting, 1991., Conference Record of the 1991 IEEE
  • Conference_Location
    Dearborn, MI, USA
  • Print_ISBN
    0-7803-0453-5
  • Type

    conf

  • DOI
    10.1109/IAS.1991.178000
  • Filename
    178000