• DocumentCode
    2842928
  • Title

    Nickel solder ball performance for Pb-free LFBGA assembly under oxygenous reflow

  • Author

    Shih, Tien-Tsorng ; Chen, Wei-Chih ; Lee, Win-Der ; Wang, Mu-Chun

  • Author_Institution
    Dept. of Electron. Eng., Nat. Kaohsiung Univ. of Appl. Sci., Hsinchu, Taiwan
  • fYear
    2011
  • fDate
    19-21 Oct. 2011
  • Firstpage
    439
  • Lastpage
    442
  • Abstract
    Due to the technology improvement of ball-grid-array (BGA) package, the high-pin count concept was derived to the mass production. The low profile fine pitch BGA (LFBGA) package was employed to gain the assembly competition. The smaller diameter of solder ball, 0.3 mm, must be incorporated and the composition of solder ball needs to be modified such as including nickel to strengthen the adhesion capability in IMC layer. Since the oxygen concentration in flow process usually works upon the quality of solder joint such as oxidation causing aged effect and quality of inter-metal compound, the oxygen variance is checked in this study. Furthermore, the flux as solder assistance is also a cardinal factor affecting the solder adherence between LFBGA substrate and solder ball. Adopting the temperature cycling test, shear test and drop test to understand the adhesion ability for lead-free solder balls on LFBGA substrate assisted with several fluxes, the optimal process recipe was obtained. The soldering performance was promoted well.
  • Keywords
    adhesion; ball grid arrays; oxidation; solders; IMC layer; LFBGA substrate; Pb-free LFBGA assembly; adhesion capability; ball-grid-array package; drop test; high-pin count concept; lead-free solder balls; low profile fine pitch BGA package; mass production; nickel solder ball performance; oxidation; oxygen concentration; oxygenous reflow; shear test; solder assistance; temperature cycling test; Adhesives; Copper; Lead; Nickel; Soldering; Substrates; Tin;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microsystems, Packaging, Assembly and Circuits Technology Conference (IMPACT), 2011 6th International
  • Conference_Location
    Taipei
  • ISSN
    2150-5934
  • Print_ISBN
    978-1-4577-1387-3
  • Electronic_ISBN
    2150-5934
  • Type

    conf

  • DOI
    10.1109/IMPACT.2011.6117250
  • Filename
    6117250