• DocumentCode
    2842942
  • Title

    Prediction of silicon content in hot metal based on RS-LSSVM model

  • Author

    Wang, Yikang ; Min Zhao

  • Author_Institution
    Coll. of Sci., China Jiliang Univ., Hangzhou, China
  • fYear
    2010
  • fDate
    26-28 May 2010
  • Firstpage
    3486
  • Lastpage
    3491
  • Abstract
    A model for prediction of silicon content in hot metal is proposed based on two integrated algorithms: attribute reduction algorithm of rough sets (RS) and least square support vector machine (LSSVM). Rough sets theory is used to construct decision table, discrete attributes, rank the importance of attributes and reduce attributes based on weighting-coefficient cumulative estimation. The key factors are extracted as the input variables of LSSVM. The method can reduce the dimensions of the data and the complexity, and improve the efficiency of training and the accuracy of prediction. The data of the model are collected from No.6 Blast Furnace in Baotou Iron and Steel Group Co. of China. The results show that the LSSVM model based on RS attribute reduction has better prediction results than the model using other variables. The hit rate of silicon content in hot metal reaches 90% at the range of ± 0.1 % based on the proposed model, which can meet the requirement of practical production.
  • Keywords
    metallurgy; rough set theory; support vector machines; RS-LSSVM model; attribute reduction algorithm; hot metal; least square support vector machine; rough sets theory; silicon content prediction; weighting-coefficient cumulative estimation; Accuracy; Blast furnaces; Data mining; Input variables; Iron; Least squares methods; Predictive models; Rough sets; Silicon; Support vector machines; Least Square Support Vector Machine; Prediction; Rough Sets; Silicon Content in Hot Metal;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Control and Decision Conference (CCDC), 2010 Chinese
  • Conference_Location
    Xuzhou
  • Print_ISBN
    978-1-4244-5181-4
  • Electronic_ISBN
    978-1-4244-5182-1
  • Type

    conf

  • DOI
    10.1109/CCDC.2010.5498541
  • Filename
    5498541