DocumentCode :
2842954
Title :
Oxygenous reflow affecting performance of Pb-free TFBGA assembly
Author :
Shih, Tien-Tsorng ; Chen, Wei-Chih ; Lee, Win-Der ; Wang, Mu-Chun
Author_Institution :
Dept. of Electron. Eng., Nat. Kaohsiung Univ. of Appl. Sci., Hsinchu, Taiwan
fYear :
2011
fDate :
19-21 Oct. 2011
Firstpage :
443
Lastpage :
446
Abstract :
More high-pin count package and thinner thickness of ball-grid-array (BGA) substrate are appreciated in the recent commercial electronic products. Using thin profile fine-pitch BGA (TFBGA) substrate incorporated into the assembly line is a feasible solution. To expose the possibility with this substrate, two species of lead-free solder balls with and without nickel were applied and the oxygen concentration impacting the solder quality in reflow process was considered. The flux assistance for solderability was adopted to verify the integration capability in assembly mass production. The temperature effect attacking the solder adhesion due to the thermal stress and the difference of thermal expansion coefficients for entire package products was also taken into concern. Using the shear test and drop test could clarify the solder adherence between solder ball and TFBGA carrier substrate. Finally, the Cpk values for all of test groups were greater than 1.33, which demonstrated the TFBGA substrate was suitable to be employed in the high-pin count and high-profit electronic products.
Keywords :
adhesion; assembling; ball grid arrays; fine-pitch technology; reflow soldering; solders; thermal stresses; TFBGA assembly; assembly mass production; ball-grid-array substrate; drop testing; lead-free solder ball; oxygenous reflow process; shear testing; solder adhesion; solder quality; solderability flux assistance; temperature effect; thermal expansion coefficient difference; thermal stress; thin profile fine-pitch BGA assembly; Adhesives; Copper; Nickel; Soldering; Substrates; Tin;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microsystems, Packaging, Assembly and Circuits Technology Conference (IMPACT), 2011 6th International
Conference_Location :
Taipei
ISSN :
2150-5934
Print_ISBN :
978-1-4577-1387-3
Electronic_ISBN :
2150-5934
Type :
conf
DOI :
10.1109/IMPACT.2011.6117251
Filename :
6117251
Link To Document :
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