DocumentCode :
2843026
Title :
COUPLING ELECTRON-BEAM PROBING WITH KNOWLEDGE-BASED FAULT LOCALIZATION
Author :
Marzouki, M. ; Laurent, J. ; Courtois, B.
fYear :
1991
fDate :
26-30 Oct 1991
Firstpage :
238
Keywords :
Circuit faults; Circuit simulation; Circuit testing; Computational modeling; Design automation; Dictionaries; Prototypes; Very large scale integration; Voltage; Wires;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Conference, 1991, Proceedings., International
ISSN :
1089-3539
Print_ISBN :
0-8186-9156-5
Type :
conf
DOI :
10.1109/TEST.1991.519515
Filename :
519515
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2843026
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