Title :
Delay analysis using FDTD for source synchronous interfaces
Author :
Hashemi, M.R. ; Mittra, R. ; de Araujo, D.N. ; Cases, M. ; Pham, N. ; Matoglu, E. ; Patel, P. ; Herrman, B.
Author_Institution :
Electromagn. Commun. Lab., Pennsylvania State Univ., University Park, PA, USA
Abstract :
This paper investigates delay and current return effects utilizing a parallel conformal finite difference time domain (PFDTD) method [Wenhua Yu, 2003]. Methodology, modeling, and integration to system level simulation for several interconnect structures are presented.
Keywords :
delays; finite difference time-domain analysis; integrated circuit interconnections; integrated circuit modelling; current return effects; delay analysis; delay return effects; finite difference time domain method; interconnect structures; parallel conformal method; source synchronous interfaces; system level simulation; Clocks; Delay effects; Finite difference methods; Frequency; Impedance; Packaging; Stripline; Testing; Time domain analysis; Voltage;
Conference_Titel :
Electrical Performance of Electronic Packaging, 2005. IEEE 14th Topical Meeting on
Print_ISBN :
0-7803-9220-5
DOI :
10.1109/EPEP.2005.1563741
