• DocumentCode
    2843094
  • Title

    Impact on inter symbol interference (ISI) noise due to simulation error

  • Author

    Bhattacharyya, Bidyut K. ; Xu, Bao Shu ; Bhattacharya, Sikha

  • Author_Institution
    Intel Corp., USA
  • fYear
    2005
  • fDate
    24-26 Oct. 2005
  • Firstpage
    221
  • Lastpage
    224
  • Abstract
    In this paper, we are going to discuss the error in determining the actual intersymbol interference noise (ISI) due to different circuit simulation methodology, while using a standard circuit simulator. In this paper, we have compared three different methods to predict accurately ISI noise. All three methods show that errors caused by circuit simulation can make the eye worst. We have also shown a method which allows one to determine that error and calculate the actual range of ISI noise. As we move towards sampling mVolt signals at the receiver end (Bhattacharyya, 2004 and Bhattacharyya, 2005), one needs to minimize the error that arises due to circuit simulation methodology. This is essential, in order to predict the actual performance of the interconnect.
  • Keywords
    circuit simulation; integrated circuit interconnections; integrated circuit noise; intersymbol interference; circuit simulation error; inter symbol interference noise; interconnect performance; Circuit noise; Circuit simulation; Computational modeling; Frequency; Integrated circuit interconnections; Intersymbol interference; Pulse measurements; Sampling methods; Transmitters; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Performance of Electronic Packaging, 2005. IEEE 14th Topical Meeting on
  • Print_ISBN
    0-7803-9220-5
  • Type

    conf

  • DOI
    10.1109/EPEP.2005.1563742
  • Filename
    1563742