DocumentCode
2843180
Title
Scalable driver I/O macromodels for statistical analysis
Author
Mutnury, Bhyrav ; Swaminathan, Madhavan ; Cases, Moises ; Pham, Nam ; De Araujo, Daniel N. ; Matoglu, Erdem
Author_Institution
Sch. of Electr. & Comput. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
fYear
2005
fDate
24-26 Oct. 2005
Firstpage
239
Lastpage
242
Abstract
In this paper, scalable driver I/O macromodels have been proposed for efficient signal integrity and timing analysis of today´s high-speed systems. Variations in semiconductor process, temperature, and power supply voltage affect the output voltage and current in driver circuits. The effect of these variations on driver and receiver circuits has been captured using Lagrange´s interpolation technique. In this paper, scalable macromodeling approach has been applied to differential driver circuits and single-ended driver and receiver circuits. Scalable driver and receiver circuits consume less CPU memory and simulation time compared to transistor-level driver and receiver circuits. The accuracy of scalable macromodels has been tested on various test cases for differential driver and single-ended driver-receiver circuits and results yielded good accuracy.
Keywords
driver circuits; integrated circuit modelling; integrated circuit testing; interpolation; statistical analysis; I/O macromodels; Lagrange interpolation technique; differential driver circuits; receiver circuits; scalable macromodeling; semiconductor process; signal integrity; single-ended driver; statistical analysis; timing analysis; transistor-level driver; Circuit testing; Driver circuits; Interpolation; Lagrangian functions; Power supplies; Signal analysis; Statistical analysis; Temperature; Timing; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical Performance of Electronic Packaging, 2005. IEEE 14th Topical Meeting on
Print_ISBN
0-7803-9220-5
Type
conf
DOI
10.1109/EPEP.2005.1563747
Filename
1563747
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