Title :
Intelligent Monitoring System Based on the Embedded Technology: A Case Study
Author :
Liang, Xiao ; Li, En ; Liang, Zize ; Hou, Zeng-Guang ; Tan, Min
Author_Institution :
Chinese Acad. of Sci., Beijing
Abstract :
Intelligent systems for condition monitoring, alarm diagnosis and fault detection have been widely used in modern industrial manufacturing, as they are capable of providing more efficient decision making support. This paper proposes a distributed intelligent monitoring system based on the embedded technology. Using advanced RISC machines microprocessor embedded with a real-time multi-task micro kernel, the developed system possesses the functions such as data acquisition, signal preprocessing, mass storage, realtime monitoring, and remote intelligent control. In virtue of a wireless CDMA communication network, it is especially appropriate to be applied to the circumstance where building a wired network is not feasible. Design and implementation about the hardware and software of the system are presented in detail. The high performance, reliability and security of the system have been validated in the case of remote intelligent monitoring system in industrial oil exploration and production. Due to its flexible structures of both software and hardware, the developed system is easy to be adapted to other applications.
Keywords :
code division multiple access; computer aided manufacturing; condition monitoring; controller area networks; alarm diagnosis; condition monitoring; data acquisition; distributed intelligent monitoring system; embedded technology; fault detection; mass storage; real-time multi-task micro kernel; realtime monitoring; remote intelligent control; signal preprocessing; wireless CDMA communication network; Communication system security; Condition monitoring; Fault detection; Fault diagnosis; Hardware; Intelligent manufacturing systems; Intelligent systems; Machine intelligence; Manufacturing industries; Remote monitoring;
Conference_Titel :
Networking, Sensing and Control, 2007 IEEE International Conference on
Conference_Location :
London
Print_ISBN :
1-4244-1076-2
Electronic_ISBN :
1-4244-1076-2
DOI :
10.1109/ICNSC.2007.372899