DocumentCode
2843418
Title
AN APPROACH TO CHIP-INTERNAL CURRENT MONITORING AND MEASUREMENT USING AN ELECTRON BEAM TESTER
Author
Helmreich, K. ; Nagel, P. ; Wolz, W. ; Muller-Glaser, K.D.
fYear
1991
fDate
26-30 Oct 1991
Firstpage
256
Keywords
Circuit testing; Current measurement; Electron beams; Electron emission; Magnetic field measurement; Magnetic fields; Monitoring; Semiconductor device measurement; Voltage measurement; Wires;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 1991, Proceedings., International
ISSN
1089-3539
Print_ISBN
0-8186-9156-5
Type
conf
DOI
10.1109/TEST.1991.519517
Filename
519517
Link To Document